{"id":4720,"date":"2026-03-02T14:46:57","date_gmt":"2026-03-02T13:46:57","guid":{"rendered":"https:\/\/www.standardsandmore.com\/ebooks\/ieee-xplore-digital-library\/"},"modified":"2026-04-28T20:50:06","modified_gmt":"2026-04-28T18:50:06","slug":"ieee-xplore-digital-library","status":"publish","type":"page","link":"https:\/\/www.standardsandmore.com\/en\/ebooks\/ieee-xplore-digital-library\/","title":{"rendered":"IEEE Xplore Digital Library"},"content":{"rendered":"\n<div class=\"wp-block-cover alignfull\" style=\"padding-top:var(--wp--preset--spacing--60);padding-bottom:var(--wp--preset--spacing--60);min-height:50vh;aspect-ratio:unset;\"><img loading=\"lazy\" decoding=\"async\" width=\"1200\" height=\"375\" class=\"wp-block-cover__image-background wp-image-4257 size-large\" alt=\"\" src=\"https:\/\/www.standardsandmore.com\/wp-content\/uploads\/ebook-collections-header-right-1920x600-1-1200x375.jpg\" data-object-fit=\"cover\" srcset=\"https:\/\/www.standardsandmore.com\/wp-content\/uploads\/ebook-collections-header-right-1920x600-1-1200x375.jpg 1200w, https:\/\/www.standardsandmore.com\/wp-content\/uploads\/ebook-collections-header-right-1920x600-1-600x188.jpg 600w, https:\/\/www.standardsandmore.com\/wp-content\/uploads\/ebook-collections-header-right-1920x600-1-300x94.jpg 300w, https:\/\/www.standardsandmore.com\/wp-content\/uploads\/ebook-collections-header-right-1920x600-1-768x240.jpg 768w, https:\/\/www.standardsandmore.com\/wp-content\/uploads\/ebook-collections-header-right-1920x600-1-1536x480.jpg 1536w, https:\/\/www.standardsandmore.com\/wp-content\/uploads\/ebook-collections-header-right-1920x600-1.jpg 1920w\" sizes=\"auto, (max-width: 1200px) 100vw, 1200px\" \/><span aria-hidden=\"true\" class=\"wp-block-cover__background has-background-dim-20 has-background-dim\" style=\"background-color:#455366\"><\/span><div class=\"wp-block-cover__inner-container has-global-padding is-layout-constrained wp-block-cover-is-layout-constrained\">\n<div class=\"wp-block-columns is-layout-flex wp-container-core-columns-is-layout-28f84493 wp-block-columns-is-layout-flex\">\n<div class=\"wp-block-column has-black-color has-white-background-color has-text-color has-background has-link-color wp-elements-3bf2f1c7234a00caf61dd7d52d4c4b0b is-layout-flow wp-block-column-is-layout-flow\" style=\"padding-top:var(--wp--preset--spacing--20);padding-right:var(--wp--preset--spacing--40);padding-bottom:var(--wp--preset--spacing--20);padding-left:var(--wp--preset--spacing--40);flex-basis:66.66%\" data-aos=\"fade-left\" data-aos-delay=\"50\" data-aos-duration=\"1000\" data-aos-once=\"true\">\n<h1 class=\"wp-block-heading has-blue-color has-text-color has-link-color wp-elements-fdfeb781a836ee52c0b95cd705f817f0\">e-Book Collection<\/h1>\n\n\n\n<p><strong>Precise specialist knowledge for the technologies of tomorrow.<\/strong> <br\/>Access over <strong>7,600 high-quality eBook titles<\/strong> via the IEEE Xplore platform. <br\/>SAM offers you tailor-made specialist packages from the world&#8217;s leading technology publishers. Continuously expand your research with targeted collections for electrical engineering, computer science and related disciplines. <\/p>\n\n\n\n<div class=\"wp-block-buttons is-layout-flex wp-block-buttons-is-layout-flex\">\n<div class=\"wp-block-button\"><a class=\"wp-block-button__link has-white-color has-blue-background-color has-text-color has-background has-link-color wp-element-button\" href=\"https:\/\/www.standardsandmore.com\/kontakt\/\">Contact us<\/a><\/div>\n<\/div>\n<\/div>\n\n\n\n<div class=\"wp-block-column is-layout-flow wp-block-column-is-layout-flow\" style=\"flex-basis:33.33%\"><\/div>\n<\/div>\n<\/div><\/div>\n\n<div class=\"wp-block-group alignfull has-global-padding is-layout-constrained wp-block-group-is-layout-constrained\">\n<h2 class=\"wp-block-heading\"><br\/>IEEE XPLORE EBOOKS &#8211; INNOVATIONS IN ELECTRICAL ENGINEERING AND COMPUTER SCIENCE<\/h2>\n\n\n\n<p>Fast access to verified specialist knowledge is the decisive factor for technological innovation today. As your specialized partner, <strong>SAM<\/strong> offers you direct access to the latest <strong>eBook frontlists<\/strong> from the world&#8217;s leading publishers within the IEEE Xplore platform. <\/p>\n\n\n\n<p>These collections build the scientific bridge to the latest standards and provide in-depth insights into the groundbreaking developments in <strong>electrical engineering, computer science, artificial intelligence (AI) and cybersecurity<\/strong>. Rather than investing time in individual searches, these curated packages allow you to strategically build an inventory for your research institution or department. <br\/><\/p>\n\n\n\n<div class=\"wp-block-columns is-layout-flex wp-container-core-columns-is-layout-7fc3d43a wp-block-columns-is-layout-flex\">\n<div class=\"wp-block-column is-layout-flow wp-block-column-is-layout-flow\">\n<h2 class=\"wp-block-heading\">WORKING EFFICIENTLY WITH THE IEEE EBOOK COLLECTION<\/h2>\n\n\n\n<p>Managing over <strong>7,600 technical titles<\/strong> requires a clear structure. SAM helps you to make optimum use of the enormous depth of information in the IEEE Xplore environment to achieve your goals: <\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Targeted needs analysis:<\/strong> We help you select the right collections (e.g. MIT Press, Wiley or Artech House) to license exactly the resources your team really needs.<\/li>\n\n\n\n<li><strong>Central licensing:<\/strong> We bundle new releases and backfiles from various top publishers on a single, powerful interface.<\/li>\n\n\n\n<li><strong>Up-to-date guarantee:<\/strong> Get immediate access to the most important technological publications of the current year.<\/li>\n<\/ul>\n\n\n\n<figure class=\"wp-block-image size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1200\" height=\"362\" src=\"https:\/\/www.standardsandmore.com\/wp-content\/uploads\/ebooks-hero2x-1200x362.jpg\" alt=\"\" class=\"wp-image-3677\" srcset=\"https:\/\/www.standardsandmore.com\/wp-content\/uploads\/ebooks-hero2x-1200x362.jpg 1200w, https:\/\/www.standardsandmore.com\/wp-content\/uploads\/ebooks-hero2x-600x181.jpg 600w, https:\/\/www.standardsandmore.com\/wp-content\/uploads\/ebooks-hero2x-300x90.jpg 300w, https:\/\/www.standardsandmore.com\/wp-content\/uploads\/ebooks-hero2x-768x231.jpg 768w, https:\/\/www.standardsandmore.com\/wp-content\/uploads\/ebooks-hero2x.jpg 1460w\" sizes=\"auto, (max-width: 1200px) 100vw, 1200px\" \/><\/figure>\n\n\n\n<h2 class=\"wp-block-heading\">AVAILABLE EBOOK COLLECTIONS  <\/h2>\n\n\n\n<ul class=\"wp-block-list\">\n<li><a href=\"https:\/\/innovate.ieee.org\/artech-house-ebooks\/\" rel=\"nofollow noopener\" target=\"_blank\">Artech House eBooks Library<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/innovate.ieee.org\/degruyter-ebooks-library\/\" rel=\"nofollow noopener\" target=\"_blank\">De Gruyter AI &amp; Data Science eBooks Library<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/innovate.ieee.org\/ieee-wiley-ebooks\/\" rel=\"nofollow noopener\" target=\"_blank\">IEEE-Wiley eBooks Library<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/innovate.ieee.org\/manning-ebooks-library\/\" rel=\"nofollow noopener\" target=\"_blank\">Manning eBooks Library<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/innovate.ieee.org\/mit-press-ebooks\/\" rel=\"nofollow noopener\" target=\"_blank\">MIT Press eBooks Library<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/innovate.ieee.org\/packtbusiness-ebooks\/\" data-type=\"link\" data-id=\"https:\/\/innovate.ieee.org\/packtbusiness-ebooks\/\" rel=\"nofollow noopener\" target=\"_blank\">Packt Business Software and Enterprise Technology eBooks Library<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/innovate.ieee.org\/packt-ebooks-library\/\" rel=\"nofollow noopener\" target=\"_blank\">Packs eBooks Library<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/innovate.ieee.org\/river-publishers-sem-ebooks\/\" rel=\"nofollow noopener\" target=\"_blank\">River Publishers SEM eBooks Library<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/innovate.ieee.org\/princeton-university-press-ebooks\/\" rel=\"nofollow noopener\" target=\"_blank\">Princeton University Press eBooks Library<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/innovate.ieee.org\/river-publishers-ebooks\/\" rel=\"nofollow noopener\" target=\"_blank\">River Publishers eBooks Library<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/innovate.ieee.org\/sae-ebooks\/\" rel=\"nofollow noopener\" target=\"_blank\">SAE eBooks Library<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/innovate.ieee.org\/wiley-ai-ebooks\/\" rel=\"nofollow noopener\" target=\"_blank\">Wiley AI eBooks Library  <\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/innovate.ieee.org\/wiley-datasecurity-ebooks-library\/\" rel=\"nofollow noopener\" target=\"_blank\">Wiley Data and Cybersecurity eBooks Library<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/innovate.ieee.org\/wiley-semiconductors-ebooks-library\/\" rel=\"nofollow noopener\" target=\"_blank\">Wiley Semiconductors eBooks Library<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/innovate.ieee.org\/wiley-telecommunications-ebooks-library\/\" rel=\"nofollow noopener\" target=\"_blank\">Wiley Telecommunications eBooks Library<\/a><\/li>\n<\/ul>\n\n\n\n<p><br\/><br\/><br\/><\/p>\n<\/div>\n<\/div>\n<\/div>\n\n<div class=\"wp-block-columns alignfull has-white-color has-blue-turquoise-hard-gradient-background has-text-color has-background has-link-color wp-elements-905b57f3551e76dee5fc9f0cb0aa9609 is-layout-flex wp-container-core-columns-is-layout-30d0dc10 wp-block-columns-is-layout-flex\" style=\"margin-top:var(--wp--preset--spacing--60);margin-bottom:var(--wp--preset--spacing--60);padding-top:var(--wp--preset--spacing--60);padding-bottom:var(--wp--preset--spacing--60)\">\n<div class=\"wp-block-column is-vertically-aligned-bottom is-layout-flow wp-block-column-is-layout-flow\">\n<p class=\"has-text-align-right has-extra-large-font-size\" style=\"text-transform:uppercase\" data-aos=\"fade-right\" data-aos-delay=\"50\" data-aos-duration=\"1000\" data-aos-once=\"true\"><em>Murat Alkan<\/em><\/p>\n\n\n\n<p class=\"has-text-align-right\"><strong><a href=\"tel:+498925544820\">+49 89 2 55 44 82 -0<\/a><br\/><a href=\"mailto:murat.alkan@standardsandmore.com\">E-mail to Murat Alkan<\/a><\/strong><\/p>\n<\/div>\n\n\n\n<div class=\"wp-block-column is-vertically-aligned-center is-layout-flow wp-block-column-is-layout-flow\">\n<figure class=\"wp-block-image aligncenter size-full is-resized has-custom-border is-style-rounded\"><img decoding=\"async\" src=\"https:\/\/www.standardsandmore.com\/wp-content\/uploads\/116-SAM-sw&#xA9;AnikaRaube-27-scaled-e1734714485542.jpg\" alt=\"Murat Alkan, Sales Manager Academics\" class=\"wp-image-3445\" style=\"border-radius:100%;aspect-ratio:1;object-fit:cover;width:250px\"\/><\/figure>\n<\/div>\n\n\n\n<div class=\"wp-block-column is-layout-flow wp-block-column-is-layout-flow\">\n<p class=\"has-black-color has-text-color has-link-color has-extra-extra-large-font-size wp-elements-5164f06f1b1ce10211c0ae915543b45b\" data-aos=\"fade-left\" data-aos-delay=\"50\" data-aos-duration=\"1000\" data-aos-once=\"true\"><strong>Discover &amp; get started now!<\/strong><\/p>\n\n\n\n<p class=\"has-black-color has-text-color has-link-color wp-elements-166ba8c955c78a15f3a2c8fcc36c392b\">Explore our eBook collection and deepen your knowledge with the latest specialist content.<\/p>\n\n\n\n<div class=\"wp-block-buttons is-layout-flex wp-block-buttons-is-layout-flex\" data-aos=\"flip-up\" data-aos-delay=\"250\" data-aos-duration=\"1000\" data-aos-once=\"true\">\n<div class=\"wp-block-button\"><a class=\"wp-block-button__link has-blue-color has-yellow-background-color has-text-color has-background has-link-color wp-element-button\" href=\"https:\/\/www.standardsandmore.com\/kontakt\/\">Test now<\/a><\/div>\n<\/div>\n<\/div>\n<\/div>\n\n<hr class=\"wp-block-separator has-text-color has-blue-color has-alpha-channel-opacity has-blue-background-color has-background is-style-default\" style=\"margin-top:var(--wp--preset--spacing--60);margin-bottom:var(--wp--preset--spacing--60)\"\/>\n\n<h2 class=\"wp-block-heading\">Articles on the topic IEEE Xplore Digital Library<\/h2>\n\n\n<p><\/p>\n","protected":false},"excerpt":{"rendered":"<p>IEEE XPLORE EBOOKS &#8211; INNOVATIONS IN ELECTRICAL ENGINEERING AND COMPUTER SCIENCE Fast access to verified specialist knowledge is the decisive factor for technological innovation today. As your specialized partner, SAM offers you direct access to the latest eBook frontlists from the world&#8217;s leading publishers within the IEEE Xplore platform. These collections build the scientific bridge [&hellip;]<\/p>\n","protected":false},"author":6,"featured_media":1704,"parent":4665,"menu_order":60,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-4720","page","type-page","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.standardsandmore.com\/en\/wp-json\/wp\/v2\/pages\/4720","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.standardsandmore.com\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.standardsandmore.com\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.standardsandmore.com\/en\/wp-json\/wp\/v2\/users\/6"}],"replies":[{"embeddable":true,"href":"https:\/\/www.standardsandmore.com\/en\/wp-json\/wp\/v2\/comments?post=4720"}],"version-history":[{"count":1,"href":"https:\/\/www.standardsandmore.com\/en\/wp-json\/wp\/v2\/pages\/4720\/revisions"}],"predecessor-version":[{"id":4721,"href":"https:\/\/www.standardsandmore.com\/en\/wp-json\/wp\/v2\/pages\/4720\/revisions\/4721"}],"up":[{"embeddable":true,"href":"https:\/\/www.standardsandmore.com\/en\/wp-json\/wp\/v2\/pages\/4665"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.standardsandmore.com\/en\/wp-json\/wp\/v2\/media\/1704"}],"wp:attachment":[{"href":"https:\/\/www.standardsandmore.com\/en\/wp-json\/wp\/v2\/media?parent=4720"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}